With more than 30 years experience, Xenemetrix Ltd. specializes in the design, development, production and marketing of Energy-Dispersive X-Ray Fluorescence (EDXRF) systems.

Xenemetrix continuously to develop highly innovative technologies and solutions suitable for today’s ever-growing analytical challenges, performing non-destructive elemental analysis starting from Carbon (6) through Fermium (100), while providing detection limits from low parts-per-billion (ppb) to high weight percent (%wt).

Energy Dispersive X-ray Fluorescence (EDXRF) spectroscopy is one of the simplest, most accurate and economical analytical methods for the determination of the chemical composition of many types of materials. The technique, requires minimum if any sample preparation, and is suitable for almost all sample types and shapes (solids, liquids, powders and thin films). In addition to elemental analysis, EDXRF may be used to measure the thickness and composition of multi-layer thin films.

We combine the latest technological developments with innovative engineering, to provide cost-effective solutions to a wide range of industries and applications:

  • Petroleum oils and fuel
  • Ultra low Sulfur in oil
  • Plastic
  • Rubber and textiles
  • Pharmaceutical products
  • Food
  • Cosmetics and body care products
  • Geological materials
  • Mining feeds
  • Slag and tails
  • Cement
  • Heat-resistant materials
  • Glass & ceramics
  • Catalysts
  • Wafers
  • Determination of coatings on paper, film & polyester
  • Metals and alloys
  • Forensics
  • Pollution monitoring of solid and liquid waste, effluent, cleaning fluids, pools and filters.

An emphasis on quality combined with ongoing research and development has granted the company an international reputation for excellence.

Our Latest News

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16 Jun 2013

Xenemetrix company profile new movie!

Xenemetrixis proud to introduce: our company profile new movie!

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09 May 2013

New appointment – Sales and Marketing VP

Michael Uster Appointed Vice President Sales & Marketing for

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09 May 2013

Xenemetrix proud to present the new: GMS

PRESS RELEASE Toronto, CANADA, May 8, 2013

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24 Mar 2013

Thank you for visiting us during Pittcon 2013 conference

Thank you for visiting us during Pittcon 2013 conference

We would like to thank all our visitors and partners visited us on Pittcon 2013

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20 Mar 2013

Pittcon 2013 third day

Pittcon 2013 third day

Visit us at booth 3150

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Recent Articles

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04 Mar 2013

Global Monitoring of Marine Fuels and Machine Condition

The use of analytical method systems that enable the fl eet management...

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26 Dec 2012

Qualitative analysis of elements Bi-layer Polymer of PVC…

Goal: To analyze all elements present in PVC and PMMA polymer layers with special attention...

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06 Oct 2012

Analysis of precious metals in jewelry

The aim of this paper is to supply a solution for non...

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06 Dec 2010

Quantitative Analysis of Geological Samples- X-Calibur

Quantitative and qualitative analysis of geological samples (rocks and river sediments) was...

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10 Nov 2010

Quantitative Analysis of Iron in flour

A quantitative analysis of Iron in flour via Xenemetrix EDXRF Laboratory Spectrometer...

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03 Oct 2010

Minimum detection limits of several different elements in wa…

The minimum detection limits of several different elements in water and in...

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