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07 Apr 2019

Nutrients and Toxic Metals in processed foods

 

XE3374

ABSTRACT

Metals occur in all foodstuffs. Of particular concern is the presence of toxic metals, which include lead, cadmium, arsenic and mercury. The toxic metal content of foods is influenced by many factors ranging from environmental conditions during growth to post-harvest handling, processing, preparation and cooking techniques. We have developed a quick technique to accurately measure these contaminants using synthetic Organo-metallic standards to spike the samples and determine the metal content by the means of the method of standard additions.

OBJECTIVE

To measure the Heavy Metal Content (Fe, Cu, Zn, As, Hg, Pb, Cd and Sn) in commercially available pickled Jalepenos,using the Secondary Target / Direct Excitation Genius IF EDXRF instrument.

BACKGROUND

Metals occur in all foodstuffs. Of particular concern is the presence of toxic metals, which include lead, cadmium, arsenic and mercury. The toxic metal content of foods is influenced by many factors ranging from environmental conditions during growth to post-harvest handling, processing, preparation and cooking techniques. For example, metal content increases in some commodities grown in contaminated soils or atmospheres while post-harvest handling steps such as washing generally remove metal contaminants. Cooking may reduce metal content although some foods can absorb metals if the cooking water is contaminated. Metals used in food processing equipment or food packaging material may contribute to food contamination. Contamination may also occur during kitchen preparation and storage. 

 

EDXRF AS AN ANALYTICAL SOLUTION

EDXRF provides an elegant, solution to the analysis of processed foods and the choice of excitation conditions allows for superior sensitivity and improved minimum detection limits

There is a simple sample preparation method where the sample is blended in a liquidizer to a homogeneous pulp

The simple sample presentation coupled with the rapid analysis time of 300s per sample allows for good productivity with a batch of 8 samples in an automated sample carousel. Using vented sample cups stops the film from bowing, if the samples outgases.

The dynamic range of linearity covers from sub - μg/g to 20 μg/g of the element of interest and elements from Na – U can be measured by these models. The Genius IF has the added benefit of very precise targeted excitation conditions that allow for μg/g detection limits on a large number of elements from S to U.

The easy, non-destructive sample analysis with fast sample preparation times coupled with the simple excitation conditions , three conditions optimized for the elements of interest are placed in a multi-acquisition batch and optimized measuring times delivers results which are both accurate and precise. These factors make EDXRF an ideal analytical technique in simple matrices.

 


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