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EX-6600 EDXRF Spectrometer


When the ultimate level of analytical performance is needed, the Xenemetrix EX-6600 energy dispersive x-ray fluorescence (EDXRF) spectrometer is unequaled in performance.

High levels of sensitivity and selectivity are achieved through the use of a secondary target excitation mode, which delivers rapid determinations for trace and minor constituents in difficult samples, with typical MDL's of 1 ppm or less.

The EX-6600 can analyze fluorine (F) through uranium (U) with or without standards, from part-per-billion to high weight percents.

Our patented Wide Angle Geometry (WAG™); optical system and our easy to use Windows NT®; based operating software, makes the EX-6600 the first EDXRF system to offer no compromises, in sensitivity and speed of a WDXRF, analyzer at a fraction of the price.

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EX-6600 EDXRF Spectrometer
Features
Benefits
Applications
Eight Primary Beam filters and eight Secondary Targets to cover the entire periodic table from F – U Ultimate versatility in different excitation conditions for tackling the most demanding applications Major and trace elemental analysis in geological and mining applications
Patented WAG™ geometry allows both direct and polarized excitation This unique design allows very close-coupled geometry for maximized sensitivity Trace elements in soils
Ten position sample changer with (optional 18 position sample changer) Allows unattended operation for busy laboratory environments where lab staff run multiple instruments Soil remediation
The LEO Premium Si(Li) Detector Excellent Low Z element performance (F, Na, Mg, Al, Si) Petroleum catalysts
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