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New portable EDXRF system - Taking the laboratory to the field

X-Ray Fluorescence Theory

X Ray (3)

An electron can be ejected from its atomic orbital by the absorption of a light wave (photon) of sufficient energy. The energy of the photon (hv) must be greater than the energy with which the electron is bound to the nucleus of the atom. When an inner orbital electron is ejected from an atom, an electron from a higher energy level orbital will be transferred to the lower energy level orbital. During this transition a photon maybe emitted from the atom. This fluorescent light is called the characteristic X-ray of the element. The energy of the emitted photon will be equal to the difference in energies between the two orbitals occupied by the electron making the transition. Because the energy difference between two specific orbital shells, in a given element, is always the same (i.e. characteristic of a particular element), the photon emitted when an electron moves between these two levels, will always have the same energy. Therefore, by determining the energy (wavelength) of the X-ray light (photon) emitted by a particular element, it is possible to determine the identity of that element.

For a particular energy (wavelength) of fluorescent light emitted by an element, the number of photons per unit time (generally referred to as peak intensity or count rate) is related to the amount of that analyte in the sample. The counting rates for all detectable elements within a sample are usually calculated by counting, for a set amount of time, the number of photons that are detected for the various analytes’ characteristic X-ray energy lines. It is important to note that these fluorescent lines are actually observed as peaks with a semi-Gaussian distribution because of the imperfect resolution of modern detector technology. Therefore, by determining the energy of the X-ray peaks in a sample’s spectrum, and by calculating the count rate of the various elemental peaks, it is possible to qualitatively establish the elemental composition of the samples and to quantitatively measure the concentration of these elements.

More about XRF

Introduction

ED-XRF

For more details about the XRF technique please visit LearnXRF: 

LearnXRF

ED-XRF

Energy dispersive x-ray fluorescence (ED-XRF) relies on the detector and detector electronics to resolve spectral peaks due to different energy x-rays. It wasn’t until the 1960’s and early 1970’s that electronics had developed to the point that high-resolution detectors, like lithium drifted silicon, Si(Li), could be made and installed in commercial devices. Computers were also a necessity for the success of ED-XRF even if they were often as large as the instrument itself.

Hardware: 

ED-XRF is relatively simple and inexpensive compared to other techniques. It requires and x-ray source, which in most laboratory instruments is a 50 to 60 kV 50-300 W x-ray tube. Lower cost benchtop or handheld models may use radioisotopes such as Fe-55, Cd-109, Cm-244, Am-241 of Co-57 or a small x-ray tube. The second major component is the detector, which must be designed to produce electrical pulses that vary with the energy of the incident x-rays. Most laboratory ED-XRF instruments still use liquid nitrogen or Peltier cooled Si(Li) detectors, while benchtop instruments usually have proportional counters, or newer Peltier cooled PIN diode detectors, but historically sodium iodide (NaI) detectors were common. Some handheld device use other detectors such as mercuric Iodide, CdTe, and CdZnTe in addition to PIN diode devices depending largely on the x-ray energy of the elements of interest. The most recent and fastest growing detector technology is the Peltier cooled silicon drift detector (SDD), which are available in some laboratory grade EDXRF instruments.

X Ray (1)

After the source and detector the next critical component are the x-ray tube filters, which are available in most ED-XRF instrument. There function is to absorb transmit some energies of source x-rays more than other in order to reduce the counts in the region of interest while producing a peak that is well suited to exciting the elements of interest. Secondary targets are an alternative to filters. A secondary target material is excited by the primary x-rays from the x-ray tube, and then emits secondary x-rays that are characteristic of the elemental composition of the target. Where applicable secondary targets yield lower background and better excitation than filter but require approximate 100 times more primary x-ray intensity. One specialized form of secondary targets is polarizing targets. Polarizing XRF takes advantage of the principle that when x-rays are scattered off a surface they a partially polarized. The target and sample are place on orthogonal axis’ to further minimize the scatter and hence the background at the detector.

Fixed or movable detector filters, which take advantage of non-dispersive XRF principles, are sometimes added to ED-XRF devices to further improve the instruments effective resolution or sensitivity forming a hybrid EDX/NDX device.

Applications:

ED-XRF can be used for a tremendous variety of elemental analysis applications. It can be used to measure virtually every element form Na to Pu in the periodic table, in concentrations ranging from a few ppm to nearly 100 percent. It can be used for monitoring major components in a product or process or the addition of minor additive. Because XRF’s popularity in the geological field, ED-XRF instruments are often used alongside WD-XRF instruments for measuring major and minor components in geological sample.

More about XRF

Introduction

X-Ray Fluorescence Theory

 For more details about the XRF technique please visit LearnXRF: 

LearnXRF

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